Nicolae TOMOZEIU

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1) VIS-optical reflectometry:a method to investigate latex-based coatings, Nicolae Tomozeiu, J. Coat. Technol. Res., (2019) 16 (6) 1571-1580, https://doi.org/10.1007/s11998-019-00218-1

2) Nano-particle dynamics during capillary suction. Kuijpers, C.J., Huinink, H.P., Tomozeiu, N., Erich, S.J.F. & Adan, O.C.G. (2018) Journal of Colloid and Interface Science, 521, 69-80. https://doi.org/10.1016/j.jcis.2018.03.023

3) Movement of a liquid droplet within a fibrous layer: Direct pore-scale modeling and experimental observations, H. Aslannejad, H. Fathi, S.M. Hassanizadeh, A. Raoof, N. Tomozeiu, (2018) Chemical Eng. Science, (2018) vol. 191, pp 78-86, Elsevier, https://doi.org/10.1016/j.ces.2018.06.054

4) Quantitative measurements of capillary absorption in thin porous media by the Automatic Scanning Absorptometer, C.J.Kuijpers, T.A.P.van Stiphout, H.P.Huinink, N.Tomozeiu, S.J.F.Erich, O.C.G.Adan, Chemical Eng. Science, (2018) vol. 178, pp 70-81, Elsevier, https://doi.org/10.1016/j.ces.2017.12.024

5) Sorption of water-glycerol mixtures in porous Al2O3 studied with NMR imaging, C.J.Kuijpers, H.P.Huinink, N.Tomozeiu, S.J.F.Erich, O.C.G.Adan, Chemical Eng. Science, (2017) vol. 173, pp 218-229, Elsevier, https://doi.org/10.1016/j.ces.2017.07.035

6) Characterizing the hydraulic properties of paper coating layer using FIB-SEM tomography and 3D pore-scale modeling, H Aslannejad, SM Hassanizadeh, A Raoof, DAM de Winter, N Tomozeiu, M Th van Genuchten, Chemical Engineering Science, (2017) vol. 160, pp 275-280, Pergamon, https://doi.org/10.1016/j.ces.2016.11.021

7) Spectroscopic Methods to Investigate Liquid–Porous Material Interactions: An Overview of Optical and Electrical Impedance Techniques, N. Tomozeiu, Transport in Porous Media · (2016) Vol. 115, No. 3, pp 603-629, https://doi.org/10.1007/s11242-016-0683-1

8) Transport of Water–glycerol Mixtures in Porous Materials Studied with NMR Imaging, C. J. Kuijpers, H. P. Huinink, O. C. G. Adan, S. J. F. Erich, N. Tomozeiu, Computational Methods in Multiphase Flow VIII, Ed. P. Vorobieff, C.A. Brebbia, and J.L. Munoz-Cobo, ISBN: 978-1-84564-946-3, (2015), 513-526, http://dx.doi.org/10.2495/MPF150431

9) Optical spectroscopy used to investigate water evaporation rate from aqueous solution, N. Tomozeiu, Thin Solid Films, 541, (2013) 32-35, https://doi.org/10.1016/j.tsf.2012.11.114

10) New functional materials designed by laser based technology, N. Tomozeiu, Journal of intense pulsed laser and applications in advanced physiscs, vol.1 No. 1 (2011), 17-24, http://www.chalcogen.ro/13Tomozeiu.pdf

11) Electrical conduction and dielectric relaxation of a-SiOx (0<x<2) thin films deposited by reactive RF magnetron sputtering, N. Tomozeiu, Thin Solid Films, 516 (2008) 8199, https://doi.org/10.1016/j.tsf.2008.04.029

12) Structure, composition, morphology and electrical properties of amorphous SiOx (0<x<2) thin films, N Tomozeiu and H.J.H. Rheiter, Thin Solid Films, 516 (2008) 8205, https://doi.org/10.1016/j.tsf.2008.04.030

13) Optical emission studies of the gas phase during the silicon suboxide deposition by reactive rf magnetron-sputtering, N. Tomozeiu, Thin Solid Films 515 (2007) 6582, https://doi.org/10.1016/j.tsf.2006.11.121

14) Nano-scale effects of swift heavy ion irradiation in SiOx layers and multilayers
W.M. Arnoldbik, D.Knoesen, N. Tomozeiu and F.H.P.M. Habraken, Nuclear Instruments and Methods in Physics Research B 258 (2007) 199, https://doi.org/10.1016/j.nimb.2006.12.103

15) SiOx structural modifications by ion bombardment and their influence on electrical properties
A. Milella, M. Creatore, M.C.M. van de Sanden and N. Tomozeiu, J.of Optoelectronics and Advance Materials, vol 8 nr 6 (2006) 2003-2010

16) SiOx thin films deposition by r.f. magnetron reactive sputtering: structural properties designed by deposition conditions, N. Tomozeiu, J.of Optoelectronics and Advance Materials, vol 8 nr 2 (2006) 769-775

17) Effects of UV photon irradiation on SiOx (0<x<2) structural properties,
Nicolae Tomozeiu, Appl. Surf. Science 2053 (2006) 376-380, https://doi.org/10.1016/j.apsusc.2006.06.017

18) High-energy ion-beam-induced phase separation in SiOx films
W.M. Arnoldbik, N. Tomozeiu, E.D. van Hattum, R.W. Lof, A.M. Vredenberg, and F.H.P.M. Habraken, Phys. Rev. B 71, (2005) 125329, https://doi.org/10.1103/PhysRevB.71.125329
* selected and published also in Virtual Journal of Nanoscale Science & Technology, 11 April 2005, section Surface and interface properties

19) Role of spinodale decomposition in the structure of SiOx
J.J. Hapert, A.M. Vredenberg, E.E. van Faassen, N. Tomozeiu, W.M. Arnoldbik and F.H.P.M. Habraken, Phys. Rev. B69 (2004) 245202-1 – 8, https://doi.org/10.1103/PhysRevB.69.245202

20) Study of the a-Si/a-SiO2 interface deposited by r.f. magnetron sputtering
N. Tomozeiu, E.E. van Faassen, A. Palmero, W.M. Arnoldbik, A.M. Vredenberg, F.H.P.M. Habraken
Thin Solid Films, 447/448, (2004) 306-310, https://doi.org/10.1016/S0040-6090(03)01069-1

21) Desorption of O2 from SiO2 during irradiation of SiO2 with MeV/a.m.u. heavy ions
W.M. Arnoldbik, N. Tomozeiu and F.H.P.M. Habraken, Nucl. Instrum. Methods Phys. Res. B vol. 219-220 (2004) 312-316

22) Modifications in Thin Films Structures by Swift Heavy Ions
W.M. Arnoldbik, N. Tomozeiu and F.H.P.M. Habraken, Vacuum 73 (2004) 109-114

23) On the deposition process of silicon suboxides by RF magnetron reactive sputtering in Ar- O2 mixtures: theoretical and experimental approach
A. Palmero, N. Tomozeiu, A.M. Vredenberg, W. Arnoldbik and F.H.P.M. Habraken in Surface and Coatings Technology, 177-178 (2004), 215-221.

24) Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices
M. Modreanu, M. Gartner, E. Aperathitis, N. Tomozeiu, M. Androulidaki, D. Cristea and Paul Hurley
Physica E: Low-dimensional Systems and Nanostructures, Volume 16, Issues 3-4, 461-466 (2003)

25) Deuteron implantation into hexagonal silicon carbide: defects and deuterium behaviour
A.Shiryaev, A. van Veen, A. Rivera, M. van Huis, T. Bus, W.M. Arnoldbik, N. Tomozeiu, F.H.P.M. Habraken, R. Delamare and E. Ntsoenzok, Eur. Phys. J.: Applied Physics 23 (2003) 11-18

26) Electronic sputtering of thin SiO2 films by MeV heavy ions
W.M. Arnoldbik, N. Tomozeiu, F.H.P.M. Habraken, Nucl. Instrum. Methods Phys. Res. B 203 (2003) 151-157

27) Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films
J.P.R. Wells, P.J. Philips, N. Tomozeiu, F.H.P.M. Habraken and J.I. Dijkhuis, Phys. Rev. B 68 (2003) 115207

28) Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices
M. Modreanu, M. Gartner, E. Aperathitis, N. Tomozeiu, M. Androulidaki, D. Cristea and Paul Hurley, Physica E. Vol 16, 3-4 (2003) 461-466

29) Structural transition in silicon suboxides at critical oxygen content
N. Tomozeiu, E.E. van Faassen and F.H.P.M. Habraken, Annals of West University of Timisoara, Series chemistry, 12 (3) (2003) 1039-1046

30) Structure of sputtered silicon suboxide single- and multi-layers
N. Tomozeiu, E.E. van Faassen, W.M. Arnoldbik, A.M. Vredenberg, F.H.P.M. Habraken
Thin Solid Films, 420/421C, 382-385 (2002)

31) On the sputtering deposition process of silicon suboxide thin films
N.Tomozeiu, J.of Optoelectronics and Advance Materials, vol 4 nr 4, 959-964, (2002)

32) Structural properties of a-SiOx layers deposited by reactive sputtering technique
N. Tomozeiu, J. J. van Hapert, E. E. van Faassen, W. Arnoldbik, A. M. Vredenberg and
F. H. P. M. Habraken, J.of Optoelectronics and Advance Materials, vol 4 nr 3, 513-522, (2002)

33) Ion beam induced desorption from thin films: SiO2 single layers and SiO2/Si multilayers
W.M. Arnoldbik, N. Tomozeiu and F.H.P.M. Habraken, Nuclear Instruments and Methods in Physics Research B 190, 433-438 (2002)

34) Selectve interaction by ion beams to multilayers of amorphous silicon and silicon oxide
D. Knoesen, N. Tomozeiu, W.M. Arnoldbik and F.H.P.M. Habraken, Procc. of the 15-th Int. Congres. on Electron Microscopy , Durban, South-Africa (2002)

35) Analyses of a-SiO2/a-Si multilayer structures by ion beam methods and electron spin resonance
N. Tomozeiu, J.J. van Hapert, W.M. Arnoldbik, E. E. van Faassen, A.M. Vredenberg and F.H.P.M. Habraken, J. Optoelectronics and Advanced Materials, vol. 3, 563-570 (2001)

36) Microstructural and optical properties of as-deposited LPCVD silicon films
Modreanu M., Tomozeiu N., Gartner M., Cosmin P. Thin Solid Films 383, 254-257 (2001).

37) Investigation on the optical and microstructural properties of photoluminiscent LPCVD SiOxNy thin films
M. Modreanu, Mariuca Gartner, N. Tomozeiu, J. Seekamp, P Cosmin, Optical Materials 17, 145-148 (2001)

38) Compositional and structural properties of sputtered a-SiOx layers
N. Tomozeiu, W. Arnoldbik, A.M. Vredenberg and F.H.P.M. Habraken, Proced. CAS’2001, vol. 24, 221-224 (2001)

39) Charge transport through localized states in sputtered amorphous silicon suboxide
J.J. van Hapert, N. Tomozeiu, E.E. van Faassen, A.M. Vredenberg, F.H.P.M. Habraken, MRS Spring Meeting, 2001, San-Francisco vol 666, F3.6.1 – F3.6.6, (2001)

40) Optical and electrical properties of as-deposited LPCVD SiOx Ny thin films
M. Modreanu, Mariuca Gartner, N.Tomozeiu and A. Szekeres, J. Optoelectronics and Advanced Materials, vol. 3, 575-581 (2001)

41) SiC formation on Si(100) via C60 precursors
M. De Seta, N. Tomozeiu, D. Sanvitto and F. Evangelisti – Surface Science 460, 203-213 (2000)

42) Electrical Properties of LPCVD Polysilicon Deposited in the Vicinity of Amorphous – Polycrystaline Phase
N. Tomozeiu, S. Antohe and M. Modreanu – Journal of Optoelectronics and Advanced Materials Vol.2, Nr.5, 657-663 (2000)

43) On the Photoluminescence of the a-C:H Films
N. Tomozeiu, J. Seekamp, A. Ferrari and J. Niemann - J. Optoelectronics and Advanced Materials, 2(3), 241-246 (2000)

44) Electrical and Photovoltaic Properties of Photosintetized ITO/a-Si:H p-i-n/TPyP/Au Cells
S. Antohe, N. Tomozeiu, T. Stoica, L. Ion and E. Barna , Solar Energy Materials&Solar Cells, 62, 207-216 (2000)

45) Optical studies of a-C:H film deposition from CH4, CH4/He, CH4/Ar and CH4/N2 rf plasmas
N. Tomozeiu, K.J. Clay and W.I. Milne - J. Optoelectronics and Advanced Materials, 2(1), 43-52 (2000)

46) Electrical properties of LPCVD polyasilicon deposited in the vicinity of amorphous- polycrystalline phase
N. Tomozeiu, S. Antohe, M. Modreanu , J. Optoel. Adv. Mat. 2(5), 657-663 (2000)

47) Optical properties of LPCVD silicon oxynitride
M. Modreanu, N. Tomozeiu, P. Cosmin and Mariuca Gartner , Thin Solid Films, 337 (1-2), 82-84 (1999)

48) Magnetic Multipole Confinement Used in Amorphous Hydrogenated Carbon Films Deposition
N. Tomozeiu and W.I. Milne, J. Non-Crystalline Solids, 249, 180-188 (1999)

49) Optical and electrical properties of a-C:H deposited by magnetic confinement of r.f. PECVD plasma
N. Tomozeiu, A. Hart, B. Kleinsorge and W.I. Milne, Diamond and Related Materials, 8, 522-526 (1999)

50) Amorphous Phase Influence on the Optical Bandgap of Polysilicon
C. Rotaru, S. Nastase and N. Tomozeiu, Phys. Stat. Sol. (a) 171, No. 1, 365-370 (1999)

51) Optical properties of porous silicon thin films
C. Rotaru, N. Tomozeiu and G. Craciun, Journal of Molecular Structure, Vol: 480, Issue: 1, May 4, 293-296 (1999)

52) Photoemission Study of SiC Films grown by C60 Precursors
N. Tomozeiu, M. DeSeta and F. Evangelisti, J. Optoelectronics and Advanced Materials, 1(3) 37-42, (1999)

53) Material properties and tribological performance of rf-PECVD deposited DLC coatings
K.J. Clay, S.P. Speakman, N.A. Morison, N. Tomozeiu, and W.I. Milne, Diamond and Related Materials, 7, 1100-1107, (1998)

54) Physical-optical Properties of LPCVD Amorphous Silicon Rich- Nitride and Oxynitride
M. Modreanu, N. Tomozeiu, P. Cosmin and Mariuca Gartner - Proceedings CAS'98, vol. 21, 414-417 (1998)

55) The Dark Conductivity of the Polysilicon Layers
N. Tomozeiu, S. Antohe, C. Flueraru and L. Bocioaca, Romanian Reports in Physics, vol 50, 98-104 (1998)

56) Electrical Properties of Sandwich Structures with Aluminium Nitride Layers
Mihaela Tanase, C. Morosanu, V. Dumitru, Laura Tugulea and N. Tomozeiu - Proceedings CAS'98, vol. 21, 221-225, (1998)

57) A Field-Effect Transistor with Copper Phtalocyanine Thin Film
S. Antohe, N. Tomozeiu and L. Ion, Analls Bucharest University - Physics, XLVI, 98-104 (1997)

58) On the Average-gap Model in Amorphous Materials
N. Tomozeiu, CAS '97, Proceedings, Vol. 20, 211-214, (1997)

59) Optical properties of a-Si3 N4 and a-SiOx Ny
M. Modreanu, N. Tomozeiu, P. Cosmin and Mariuca Gartner, CAS '97, Proceedings, Vol. 20, 497-500, (1997)

60) Annealing effects on electrical and photoelectrical properties of polysilicon films
N. Tomozeiu, I. Munteanu, S. Antohe, C. Flueraru and Raluca Penciu, Romanian Journal of Optoelectronics, vol. 5, 1, 53-56, (1997)

61) On the optical properties of a-SiOx Ny
N. Tomozeiu, M. Modreanu, and Dana Necsoiu, Romanian Journal of Optoelectronics, vol. 5, 1, 49-52, (1997)

62) Electrical and Photoelectrical Properties of a Three-Layered organic Solar Cell with an Enlarged Photoactive Region of Codeposited Dyes
S. Antohe, D. Ionascu, V. Ruxandra, L. Tugulea, I. Spanulescu, N. Tomozeiu and I. A. Qazii
Romanian Reports in Physics, vol. 48, No 7-8 p. 581-597, (1996)

63) Steady-state Photoconductivity in a-Se0.6Te0.4
N.Tomozeiu, I. Munteanu and R. Ilie, Romanian Reports in Physics, vol 48, nr 5-6, 481-486, (1996)

64) Field Effect Transistors Based on Cooper Phtalocyanine
S. Antohe, V. Ruxandra, E. Barna, V. Gheorghe, N. Tomozeiu and I. Enculescu, Romanian Reports in Physics vol 48 No. 7-8 p. 563-569, (1996)

65) Electrical and Optical Properties of a-C:H Layers
N.Tomozeiu, G.J.Adriaenssens, W.Lauwerens, and N. Qamhieh - "Electronic, Optoelectronic and Magnetic Thin Films", Ed.: Prof. J.M. Marshall, Research Studies Press, England, and John Wiley & Sons, New York, 1995), p. 664-667. ISBN 0 86380 173 0; ISBN 0 471 95739 9

66) Photoconductivity and Optical Properties of a-Si1-x Cx :H Alloys
N.Tomozeiu, H.Herremans, N.Qamhieh and W.Grevendonk - "Electronic, Optoelectronic and Magnetic Thin Films", Ed.: Prof. J.M. Marshall, Research Studies Press, England, and John Wiley & Sons, New York, 1995, p. 660-663. ISBN 0 86380 173 0; ISBN 0 471 95739 9

67) Unhydrogenated DLC Films Obtained by Magnetron Sputtering
C. Morosanu, N. Tomozeiu, C. Cordos and T. Stoica -NATO-ASI Series, vol1, Wide Band Gap Electronic Materials, Editors M.A. Prelas, P. Gielisse, G. Popovici, B.V. Spitsyn, T. Tacy, Springer – Science + Business Media B.V. ISBN 978-94-010-4078-5, ISBN 978-94-011-0173-8 (e-book) 243-248, (1995)

68) Electrical conduction in doped polymers
M.I. Chipara, I. Munteanu and N. Tomozeiu, Romanian Reports in Physics, vol 47, 182-187, (1995)

69) Photoconduction study of a-Se60 Te40
N. Tomozeiu, I. Munteanu and Ruxandra Ilie, Romanian Reports in Physics, vol 47, 253-260, (1995)

70) The Influence of Magnetic Field on a-Si:H Photoconductivity
N. Tomozeiu and I. Munteanu, Turkish Journal of Physics vol 18, 2-7, (1994)

71) On the Photoconductivity Study in a-SiC:H Alloys
N. Tomozeiu, N. Qamhieh and Mariana Tomozeiu - Proce. Supplement of Balkan Physics. Letters, vol 2 part one, 81-84, (1994)

72) Optical modulation spectroscopy of a-SiC:H alloys
N. Tomozeiu, Romanian Journal of Physics 39, 441-447, (1994).

73) Frequency Dependence of Conductivity on a-C:H Thin Films
N. Tomozeiu and T. Stoica, CAS '94, Proceedings, Vol. 17, 392-396, (1994)

74) On the Switching and Memory Phenomena in Amorphous InSe Thin Films
I.Munteanu, N.Tomozeiu and L.Ion - Romanian Journal of Physics 39, 362-369, (1994)

75) Optical Properties of Amorphous Carbon
N.Tomozeiu, W.Lauwerens and Mariana Tomozeiu, Romanian Reports in Physics, 46, nr 7-8, 27-32, (1994)

76) Theory of Carrier Transport Mechanism through Organic-on-Inorganic Semiconductor Diodes
S. Antohe, N. Tomozeiu and A.R. Atonm, Romanian Reports in Physics 46, 711-720, (1994)

77) On the Magnetic Field Dependence of Hydrogenated Amorphous Silicon Photoconductivity
N.Tomozeiu and I.Munteanu, Annals of Bucharest University, Physics, XLII, 67-73, (1993)

78) On the Photoconductivity in Hydrogenated Amorphous Silicon
I.Licea and N. Tomozeiu Phys. Stat. Sol. (b) 179, 513-520, (1993) https://doi.org/10.1002/pssb.2221790224

79) The a.c. Admittance Characteristics of Organic -on- Inorganic Contact Barriers
S. Antohe, I. Munteanu, N. Tomozeiu and A. Vonsovici, CAS '91, Proceedings, Vol. 14, p215-218, (1991)

80) Properties of the Organic-on-Inorganic Semiconductor Barrier Contact Diodes In/PTCDI/p-Si and Ag/CuPc/p-Si
S. Antohe, N. Tomozeiu and S. Gogonea, Phys. Stat. Sol. (a) 125, 397-407 (1991)